A scanning electron microscope (SEM) scans a focused electron beam over a surface to create an image. The electrons in the beam interact with the sample, producing various signals that can be used to obtain information about the surface topography and composition.
Dataset Name | PI-Supplied Description | PI-Supplied Name |
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Scanning Electron Microscopy (SEM) photographs of biofilms on indium tin oxide electrodes from cathodic poised potential experiments with subsurface crustal samples from CORK borehole observatories at North Pond on the Mid-Atlantic Ridge during R/V A | Zeiss Supra25 field emission scanning microscope | |
Scanning Electron Microscopy (SEM) photographs of biofilms and mineral alteration products from R/V Atlantis AT39-01 in the North Pond CORK Sites U1382A, U1383C from 2011-2017 | Zeiss Supra25 field emission scanning microscope | Zeiss Supra25 field emission scanning microscope |
Geochemistry summary data: single cell isotope incorporation of 1H, 2H, 12C14N, 12C15N, 12C12C, 12C13C ions from Chikyu-337 (IODP 337) | Scanning electron microscopy (SEM) of the filters was done on a Zeiss 1550 VP Field Emission Scanning Electron Microscope at the GPS Division Analytical Facility at Caltech. | Zeiss 1550 VP Field Emission Scanning Electron Microscope |
Single cell isotope incorporation of 1H, 2H, 12C14N, 12C15N. 12C12C, 12C13C from Chikyu-337 (IODP 337) | Scanning electron microscopy (SEM) of the filters was done on a Zeiss 1550 VP Field Emission Scanning Electron Microscope at the GPS Division Analytical Facility at Caltech. | Zeiss 1550 VP Field Emission Scanning Electron Microscope |
Size-binned particle abundance and biovolume of the gut contents of salps imaged via scanning electron microscopy on the "SalpPOOP" cruise on R/V Tangaroa during October and November 2018 | FEI Nova 400 NanoSEM set to an accelerating voltage of 10 kV | |
Particle size, volume, and converted biomass from the gut contents of salps imaged via scanning electron microscopy on the "SalpPOOP" cruise on R/V Tangaroa during October and November 2018 | FEI Nova 400 NanoSEM set to an accelerating voltage of 10 kV | |
Scanning electron micrographs of microbial sulfide deposition from (INSPIRE_Pyrite project) | Scanning Electron Microscopy coupled with Energy Dispersive X-ray (SEM/EDX) Spectroscopy. "Scanning electron microscopy with energy dispersive X-ray spectroscopy (SEM/EDX) is the best known and most widely-used of the surface analytical techniques. High resolution images of surface topography, with excellent depth of field, are produced using a highly-focused, scanning (primary) electron beam. The primary electrons enter a surface with an energy of 0.5 – 30 kV and generate many low energy secondary electrons. The intensity of these secondary electrons is largely governed by the surface topography of the sample. An image of the sample surface can thus be constructed by measuring secondary electron intensity as a function of the position of the scanning primary electron beam. High spatial resolution is possible because the primary electron beam can be focused to a very small spot ( | SEM/EDX |
Energy-dispersive X-ray spectroscopy (EDS) spectra and scanning electron microscope (SEM) images from phytoplankton Si utilization experiments during 8-day laboratory cultures in 2016 and 2017. | EDS: Energy-dispersive X-ray spectroscopy (EDS) is a technique that can be performed in a scanning electron microscope (SEM) whereby accelerated electrons interact with the specimen generating x-ray photons that are characteristic for specific elements. Therefore, EDS allows for element identification and quantification. Below are the SEMs used with respective EDS analysis systems: Zeiss Auriga SEM equipped with Bruker Quantax EDS detector and analysis software for elemental analysis. FEI Verios 460L SEM equipped with Oxford Xmax silicon drift EDS detector and AZtec acquisition and analysis software for elemental analysis. | |
Smallmouth grunt condition/otolith morphology data and SEM images | JEOL JSM-6010LA IntouchScope Scanning Electron Microscope | |
Coccolith morphology data from an experiment examining the effect of Sr on the coccolithophore Scyphosphaera apsteinii calcification | SEM and EDS: Energy-dispersive X-ray spectroscopy (EDS) is a technique that can be performed in a scanning electron microscope (SEM) whereby accelerated electrons interact with the specimen generating x-ray photons that are characteristic for specific elements. Therefore, EDS allows for element identification and quantification. Below is the SEM used with respective EDS analysis system: FEI Verios 460L SEM equipped with Oxford Xmax silicon drift EDS detector and AZtec acquisition and analysis software for elemental analysis. | FEI Verios 460L SEM |
Energy-dispersive X-ray spectroscopy (EDS) from an experiment examining the effect of Sr on the coccolithophore Scyphosphaera apsteinii calcification | SEM and EDS: Energy-dispersive X-ray spectroscopy (EDS) is a technique that can be performed in a scanning electron microscope (SEM) whereby accelerated electrons interact with the specimen generating x-ray photons that are characteristic for specific elements. Therefore, EDS allows for element identification and quantification. Below is the SEM used with respective EDS analysis system: FEI Verios 460L SEM equipped with Oxford Xmax silicon drift EDS detector and AZtec acquisition and analysis software for elemental analysis. | FEI Verios 460L SEM |