Goldstein, J. I., Newbury, D. E., Michael, J. R., Ritchie, N. W. M., Scott, J. H. J., & Joy, D. C. (2018). Scanning Electron Microscopy and X-Ray Microanalysis. Springer Science + Business Media, LLC, New York. (Third edition) https://doi.org/10.1007/978-1-4939-6676-9
Dataset | Relation |
---|---|
Test dataset created for testing and troubleshooting purposes | Methods, Methods |