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DOI: 10.1007/978-1-4939-6676-9

Citation Style: APA

Citation Text:

Goldstein, J. I., Newbury, D. E., Michael, J. R., Ritchie, N. W. M., Scott, J. H. J., & Joy, D. C. (2018). Scanning Electron Microscopy and X-Ray Microanalysis. Springer Science + Business Media, LLC, New York. (Third edition) https://doi.org/10.1007/978-1-4939-6676-9